Microstructural analysis through X-Ray Diffraction techniques Corso seminariale
Aula: Aula 5 e Aula 2 - Ore: 9.30
Via Musei 41, Brescia
prof. Luca Gavioli
Università Cattolica del Sacro Cuore
Dott. Mirco Chiodi
When interacting with matter, photons are mainly scattered by electrons through the interaction with their electric field E. Not considering absorption phenomena, this interaction is usually either elastic AND coherent or inelastic AND incoherent. The elastic/coherent scattering of photons of an adequate energy (X-Rays) can contain a large amount of information about the structure of the illuminated material and it is the basis of (almost) any X-ray Diffraction technique. In this workshop, we will first briefly introduce the theoretical picture used to describe the scattering process and then we will focus on the most common X-Ray diffraction techniques used in both standard and synchrotron laboratories.
Grain size, preferential crystallographic orientations, texture, stress, density and/or thickness can be estimated using the appropriate XRD technique. An overview of the most significant ones will be given using real-life experiments and examples.